by Miron Abramovici , Melvin A. Breuer , Arthur D. Friedman  <br/><br/>
Digital Systems Testing And Testable Design 

 - 1st 
 - Mumbai  Jaico Publishing House  2011 
 - 652 
<br/><br/><label>ISBN: </label>978-8172248918 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ELECTRONICS
<br/><br/><label>Dewey Class. No.: </label>621.395  / ABR/D