000 00412nam a22001577a 4500
020 _a978-8172248918
082 _a621.395
_bABR/D
100 _aby Miron Abramovici , Melvin A. Breuer , Arthur D. Friedman
245 _aDigital Systems Testing And Testable Design
250 _a1st
260 _aMumbai
_bJaico Publishing House
_c2011
300 _a652
650 _aELECTRONICS
942 _cBK
999 _c4050
_d4050